RETURN TO ALL INVENTIONS LIST

RETURN TO DIAGNOSTICS LIST

RETURN TO DEVICES LIST

Multi-parameter X-ray computed tomography

Patent Number: US8121249
 
Executive Summary:

• Invention Type: Diagnostic and Device
• Patent Status: Active
• Patent Link: https://patents.google.com/patent/US8121249/
• Research Institute: Virginia Tech
• Disease Focus: Cancer
• Basis of Invention: X-ray computed tomography
• How it works: Systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone
• Lead Challenge Inventor: Ge Wang
• Inventors: Ge Wang, Wenxiang Cong
• Development Stage: Human data
• Novelty:
  • Acquiring x-ray projection data multiple times with varying collimation is a key feature of obtaining high quality, high contrast images.
• Clinical Applications:
  • Medical imaging

 
General Description:
This invention involves techniques for extraction of small-angle scattering signals for dark field tomography, while traditional attenuation-based tomography can also be simultaneously performed in cone-beam geometry. This allows for high quality, high contrast images using high-quality x-ray small-angle scattering signals, allowing a significant reduction of the x-ray dose.

Strengths:

• This scheme can acquire high-quality x-ray small-angle scattering signals, allowing a significant reduction of the x-ray dose

 
Weaknesses:

• Expensive piece of equipment to replace already existing equipment

 
Patent Status:

• Priority date: 2009-06-04
• Filing date: 2010-12-09
• Publication date: 2012-02-21
• Grant date: 2012-02-21

 
Inventor Bio: Ge Wang
http://www.sbes.vt.edu/people/bio.php?person=Ge-Wang